Three-dimensional orientation mapping in the transmission electron microscope.

Scanning precession electron tomography for three-dimensional nanoscale orientation imaging and crystallographic analysis

Three-dimensional (3D) reconstructions from electron tomography provide important morphological, compositional, optical and electro-magnetic information across a wide range of materials and devices. Precession electron diffraction, in combination with scanning transmission electron microscopy, can be used to elucidate the local orientation of crystalline materials. Here we show, using the examp...

Orientation Microscopy in the Transmission Electron Microscope - Investigations of Small Orientations Changes by Means of Orientation Mapping in TEM

Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps.

Stereological analysis has been coupled with transmission electron microscope (TEM) orientation mapping to investigate the grain boundary character distribution in nanocrystalline copper thin films. The use of the nanosized (<5 nm) beam in the TEM for collecting spot diffraction patterns renders an order of magnitude improvement in spatial resolution compared to the analysis of electron backsca...

Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

Transmission electron backscattered diffraction, t-EBSD, in the scanning electron microscope, SEM, was initially described in 2010 [1]. After slow initial acceptance, the number of publications in which it is used is increasing markedly. Many of the first applications took advantage of the higher resolution of t-EBSD in the study of thin films [2], [3]. More recently it is being used for pre-sc...

Towards 3D crystal orientation reconstruction using automated crystal orientation mapping transmission electron microscopy (ACOM-TEM)

To relate the internal structure of a volume (crystallite and phase boundaries) to properties (electrical, magnetic, mechanical, thermal), a full 3D reconstruction in combination with in situ testing is desirable. In situ testing allows the crystallographic changes in a material to be followed by tracking and comparing the individual crystals and phases. Standard transmission electron microscop...